On the integration of microwave curing systems into microelectronics assembly processes
| Title | On the integration of microwave curing systems into microelectronics assembly processes |
| Publication Type | Conference Paper |
| Year of Publication | 2010 |
| Authors | Adamietz R, Mü andller G, Othman N, Eicher F, Tilford T, Ferenets M, Pavuluri SK, Desmulliez MPY, Bailey C |
| Conference Name | Electronic System-Integration Technology Conference (ESTC), 2010 3rd |
| Date Published | sept. |
| Keywords | assembling, curing, electronics packaging, embedded microwave curing system, encapsulant material, flip-chip, flip-chip devices, integrated circuits, integrated system, microelectronics assembly process, microelectronics packaging, microwave energy, microwave ovens, microwave-assisted assembly, open-ended microwave oven, polymers, precision placement machine, thermosetting polymer curing, thermosetting polymer material |
| Abstract | In microelectronics packaging applications a variety of thermosetting polymer materials is applied. Such materials are dispensed in a liquid form and are heated with the intent to cure them. Conventional processes often take several hours to bring the material up to temperatures which result in a significant rate of cure. An alternative approach to curing thermosetting polymers is the use of microwave energy, which has been shown to cure encapsulant materials in substantially shorter times. A recent innovation is the open-ended microwave oven proposed by Sinclair et al.. This paper deals with the implementation of the open-ended microwave oven into a precision placement machine. Two test products for encapsulation and flip-chip serve as objective for microwave-assisted assembly. An integrated system setup including the open ended oven is presented. Modifications on the open-ended microwave oven are described and a concept for the development of an embedded microwave curing system is presented. Tests on curing encapsulant materials dispensed over a commercially available QFN were performed to determine post-process functionality of the package, with no evident detrimental effects. |
| DOI | 10.1109/ESTC.2010.5642827 |


